93c76(86).pdf

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93LC76/86
8K/16K 2.5V Microwire
®
Serial EEPROM
FEATURES
• Single supply with programming operation down
to 2.5V
• Low power CMOS technology
- 1 mA active current typical
- 5
µA
standby current (typical) at 3.0V
• ORG pin selectable memory configuration
1024 x 8 or 512 x 16 bit organization (93LC76)
2048 x 8 or 1024 x 16 bit organization (93LC86)
• Self-timed ERASE and WRITE cycles
(including auto-erase)
• Automatic ERAL before WRAL
• Power on/off data protection circuitry
• Industry standard 3-wire serial I/O
• Device status signal during ERASE/WRITE
cycles
• Sequential READ function
• 1,000,000 ERASE/WRITE cycles guaranteed
• Data retention > 200 years
• 8-pin PDIP/SOIC package
• Temperature ranges available
- Commercial (C)
0°C to +70°C
- Industrial (I)
-40°C to +85°C
PACKAGE TYPES
DIP Package
CS
CLK
DI
DO
1
2
3
4
8
7
6
5
V
CC
PE
ORG
V
SS
93LC76/86
SOIC Package
1
2
3
4
8
7
6
5
93LC76/86
CS
CLK
DI
DO
V
CC
PE
ORG
V
SS
BLOCK DIAGRAM
V
CC
V
SS
DESCRIPTION
The Microchip Technology Inc. 93LC76/86 are 8K and
16K low voltage serial Electrically Erasable PROMs.
The device memory is configured as x8 or x16 bits
depending on the ORG pin setup. Advanced CMOS
technology makes these devices ideal for low power
non-volatile memory applications. These devices also
have a Program Enable (PE) pin to allow the user to
write protect the entire contents of the memory array.
The 93LC76/86 is available in standard 8-pin DIP and
8-pin surface mount SOIC packages.
Memory
Array
Address
Decoder
Address
Counter
Data
Register
DI
Output
Buffer
DO
PE
CS
Mode
Decode
Logic
CLK
Clock
Generator
Microwire is a registered trademark of National Semiconductor Incorporated.
©
1998 Microchip Technology Inc.
Preliminary
DS21131D-page 1
93LC76/86
1.0
1.1
ELECTRICAL
CHARACTERISTICS
Maximum Ratings*
TABLE 1-1:
Name
CS
CLK
DI
DO
V
SS
ORG
PE
V
CC
PIN FUNCTION TABLE
Function
Chip Select
Serial Data Clock
Serial Data Input
Serial Data Output
Ground
Memory Configuration
Program Enable
Power Supply
V
CC
...................................................................................7.0V
All inputs and outputs w.r.t. V
SS
............... -0.6V to Vcc +1.0V
Storage temperature ..................................... -65˚C to +150˚C
Ambient temp. with power applied................. -65˚C to +125˚C
Soldering temperature of leads (10 seconds) ............. +300˚C
ESD protection on all pins................................................4 kV
*Notice:
Stresses above those listed under “Maximum ratings”
may cause permanent damage to the device. This is a stress rat-
ing only and functional operation of the device at those or any
other conditions above those indicated in the operational listings
of this specification is not implied. Exposure to maximum rating
conditions for extended periods may affect device reliability
1.2
AC Test Conditions
AC Waveform:
V
LO
= 2.0V
V
HI
= Vcc - 0.2V
V
HI
= 4.0V for
(Note 1)
(Note 2)
Timing Measurement Reference Level
Input
Output
Note 1: For V
CC
4.0V
2: For V
CC
> 4.0V
0.5 V
CC
0.5 V
CC
TABLE 1-2:
DC CHARACTERISTICS
Applicable over recommended operating ranges shown below unless otherwise noted:
V
CC
= +2.5V to +6.0V
Commercial (C): Tamb = 0˚C to +70˚C
Industrial (I):
Tamb = -40˚C to +85˚C
Parameter
High level input voltage
Low level input voltage
Low level output voltage
High level output voltage
Input leakage current
Output leakage current
Pin capacitance
(all inputs/outputs)
Operating current
Symbol
V
IH1
V
IH2
V
IL1
V
IL2
V
OL1
V
OL2
V
OH1
V
OH2
I
LI
I
LO
C
INT
I
CC
write
I
CC
read
I
CCS
Min.
2.0
0.7 V
CC
-0.3
-0.3
2.4
V
CC
-0.2
-10
-10
Max.
V
CC
+1
V
CC
+1
0.8
0.2 V
CC
0.4
0.2
10
10
7
3
1
500
100
30
Units
V
V
V
V
V
V
V
V
µA
µA
pF
mA
mA
µA
µA
µA
Conditions
V
CC
2.7V
V
CC
< 2.7V
V
CC
2.7V
V
CC
< 2.7V
I
OL
= 2.1 mA; V
CC
= 4.5V
I
OL
=100
µA;
V
CC
= V
CC
Min.
I
OH
= -400
µA;
V
CC
= 4.5V
I
OH
= -100
µA;
V
CC
= V
CC
Min.
V
IN
= 0.1V to V
CC
V
OUT
= 0.1V to V
CC
(Note Note:)
Tamb = +25˚C, F
CLK
= 1 MHz
V
CC
= 5.5V
F
CLK
= 3 MHz; V
CC
= 5.5V
F
CLK
= 1 MHz; V
CC
= 3.0V
CLK = CS = 0V; V
CC
= 5.5V
CLK = CS = 0V; V
CC
= 3.0V
DI = PE = V
SS
ORG = V
SS
or V
CC
Standby current
Note:
This parameter is periodically sampled and not 100% tested.
DS21131D-page 2
Preliminary
©
1998 Microchip Technology Inc.
93LC76/86
TABLE 1-3:
AC CHARACTERISTICS
Applicable over recommended operating ranges shown below unless otherwise noted:
V
CC
= +2.5V to +6.0V
Commercial (C): Tamb = 0˚C to +70˚C
Industrial (I):
Tamb = -40˚C to +85˚C
Parameter
Clock frequency
Clock high time
Clock low time
Chip select setup time
Chip select hold time
Chip select low time
Data input setup time
Data input hold time
Data output delay time
Data output disable time
Status valid time
Program cycle time
Symbol
F
CLK
T
CKH
T
CKL
T
CSS
T
CSH
T
CSL
T
DIS
T
DIH
T
PD
T
CZ
T
SV
T
WC
T
EC
T
WL
Min.
200
300
100
200
50
100
0
250
50
100
50
100
1M
Max.
3
2
100
250
100
500
200
300
5
15
30
Units
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
ms
ms
cycles
Conditions
4.5V
2.5V
4.5V
2.5V
4.5V
2.5V
4.5V
2.5V
V
CC
6.0V
V
CC
<
4.5V
V
CC
6.0V
V
CC
<
4.5V
V
CC
6.0V
V
CC
<
4.5V
V
CC
6.0V, Relative to CLK
V
CC
<
4.5V, Relative to CLK
Endurance
Relative to CLK
4.5V
V
CC
6.0V, Relative to CLK
2.5V
V
CC
<4.5V, Relative to CLK
4.5V
V
CC
6.0V, Relative to CLK
2.5V
V
CC
<
4.5V, Relative to CLK
4.5V
V
CC
6.0V, C
L
= 100 pF
2.5V
V
CC
< 4.5V, C
L
= 100 pF
4.5V
V
CC
6.0V
2.5V
V
CC
< 4.5V (Note 1)
4.5V
V
CC
6.0V, C
L
= 100 pF
2.5V
V
CC
<4.5V, C
L
= 100 pF
ERASE/WRITE mode
ERAL mode
WRAL mode
25°C, Vcc = 5.0V, Block Mode
(Note 2)
Note 1: This parameter is periodically sampled and not 100% tested.
2: This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific
application, please consult the Total Endurance Model which can be found on our website.
©
1998 Microchip Technology Inc.
Preliminary
DS21131D-page 3
93LC76/86
TABLE 1-4:
Instruction
READ
EWEN
ERASE
ERAL
WRITE
WRAL
EWDS
INSTRUCTION SET FOR 93LC76: ORG=1 (1X16 ORGANIZATION)
SB
1
1
1
1
1
1
1
Opcode
10
00
11
00
01
00
00
Address
X A8 A7 A6 A5 A4 A3
1 1 X X X X X
X A8 A7 A6 A5 A4 A3
1 0 X X X X X
X A8 A7 A6 A5 A4 A3
0 1 X X X X X
0 0 X X X X X
A2
X
A2
X
A2
X
X
A1
X
A1
X
A1
X
X
Data In
A0
X
A0
X
A0 D15 - D0
X D15 - D0
X
Data Out
D15 - D0
High-Z
(RDY/BSY)
(RDY/BSY)
(RDY/BSY)
(RDY/BSY)
High-Z
Req. CLK
Cycles
29
13
13
13
29
29
13
TABLE 1-5:
Instruction
READ
EWEN
ERASE
ERAL
WRITE
WRAL
EWDS
INSTRUCTION SET FOR 93LC76: ORG=0 (X8 ORGANIZATION)
SB
1
1
1
1
1
1
1
Opcode
10
00
11
00
01
00
00
Address
X A9 A8 A7 A6 A5 A4
1 1 X X X X X
X A9 A8 A7 A6 A5 A4
1 0 X X X X X
X A9 A8 A7 A6 A5 A4
0 1 X X X X X
0 0 X X X X X
A3
X
A3
X
A3
X
X
A2
X
A2
X
A2
X
X
A1 A0
X
A1 A0
X
A1 A0
X
X
Data In
D7 - D0
D7 - D0
Data Out
D7 - D0
High-Z
(RDY/BSY)
(RDY/BSY)
(RDY/BSY)
(RDY/BSY)
High-Z
Req. CLK
Cycles
22
14
14
14
22
22
14
TABLE 1-6:
Instruction
READ
EWEN
ERASE
ERAL
WRITE
WRAL
EWDS
INSTRUCTION SET FOR 93LC86: ORG=1 (X16 ORGANIZATION)
SB
1
1
1
1
1
1
1
Opcode
10
00
11
00
01
00
00
A9
1
A9
1
A9
0
0
A8
1
A8
0
A8
1
0
A7
X
A7
X
A7
X
X
A6
X
A6
X
A6
X
X
Address
A5
X
A5
X
A5
X
X
A4
X
A4
X
A4
X
X
A3
X
A3
X
A3
X
X
A2
X
A2
X
A2
X
X
A1
X
A1
X
A1
X
X
Data In
A0
X
A0
X
A0 D15 - D0
X D15 - D0
X
Data Out
D15 - D0
High-Z
(RDY/BSY)
(RDY/BSY)
(RDY/BSY)
(RDY/BSY)
High-Z
Req. CLK
Cycles
29
13
13
13
29
29
13
TABLE 1-7:
Instruction
READ
EWEN
ERASE
ERAL
WRITE
WRAL
EWDS
INSTRUCTION SET FOR 93LC86: ORG=0 (X8 ORGANIZATION)
SB
1
1
1
1
1
1
1
Opcode
10
00
11
00
01
00
00
Address
A10 A9 A8 A7 A6 A5 A4
1
1 X X X X X
A10 A9 A8 A7 A6 A5 A4
1
0 X X X X X
A10 A9 A8 A7 A6 A5 A4
0
1 X X X X X
0
0 X X X X X
A3
X
A3
X
A3
X
X
A2
X
A2
X
A2
X
X
A1 A0
X
A1 A0
X
A1 A0
X
X
Data In
D7 - D0
D7 - D0
Data Out
D7 - D0
High-Z
(RDY/BSY)
(RDY/BSY)
(RDY/BSY)
(RDY/BSY)
High-Z
Req. CLK
Cycles
22
14
14
14
22
22
14
DS21131D-page 4
Preliminary
©
1998 Microchip Technology Inc.
93LC76/86
2.0
PRINCIPLES OF OPERATION
2.3
When the ORG pin is connected to V
CC
, the x16 orga-
nization is selected. When it is connected to ground,
the x8 organization is selected. Instructions, addresses
and write data are clocked into the DI pin on the rising
edge of the clock (CLK). The DO pin is normally held in
a high-Z state except when reading data from the
device, or when checking the READY/BUSY status dur-
ing a programming operation. The READY/BUSY sta-
tus can be verified during an Erase/Write operation by
polling the DO pin; DO low indicates that programming
is still in progress, while DO high indicates the device is
ready. The DO will enter the high impedance state on
the falling edge of the CS.
Erase/Write Enable and Disable
(EWEN, EWDS)
The 93LC76/86 powers up in the Erase/Write Disable
(EWDS) state. All programming modes must be pre-
ceded by an Erase/Write Enable (EWEN) instruction.
Once the EWEN instruction is executed, programming
remains enabled until an EWDS instruction is executed
or V
CC
is removed from the device. To protect against
accidental data disturb, the EWDS instruction can be
used to disable all Erase/Write functions and should
follow all programming operations. Execution of a
READ instruction is independent of both the EWEN
and EWDS instructions.
2.1
START Condition
2.4
Data Protection
The START bit is detected by the device if CS and DI
are both HIGH with respect to the positive edge of CLK
for the first time.
Before a START condition is detected, CS, CLK, and DI
may change in any combination (except to that of a
START condition), without resulting in any device oper-
ation (READ, WRITE, ERASE, EWEN, EWDS, ERAL,
and WRAL). As soon as CS is HIGH, the device is no
longer in the standby mode.
An instruction following a START condition will only be
executed if the required amount of opcode, address
and data bits for any particular instruction are clocked
in.
After execution of an instruction (i.e., clock in or out of
the last required address or data bit) CLK and DI
become don't care bits until a new start condition is
detected.
During power-up, all programming modes of operation
are inhibited until V
CC
has reached a level greater than
1.4V. During power-down, the source data protection
circuitry acts to inhibit all programming modes when
V
CC
has fallen below 1.4V.
The EWEN and EWDS commands give additional pro-
tection against accidentally programming during nor-
mal operation.
After power-up, the device is automatically in the
EWDS mode. Therefore, an EWEN instruction must be
performed before any ERASE or WRITE instruction
can be executed.
2.2
DI/DO
It is possible to connect the Data In and Data Out pins
together. However, with this configuration it is possible
for a “bus conflict” to occur during the “dummy zero”
that precedes the READ operation, if A0 is a logic
HIGH level. Under such a condition the voltage level
seen at Data Out is undefined and will depend upon the
relative impedances of Data Out and the signal source
driving A0. The higher the current sourcing capability of
A0, the higher the voltage at the Data Out pin.
©
1998 Microchip Technology Inc.
Preliminary
DS21131D-page 5
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